• 100% of material throughput
• Easy to clean
• No particle trapping
• ASTM/ISO compliant
• Accurate round or square apertures from 3 to 250 microns
• Multi-level support layer available
• Up to 1,000 LPI
• Standard & custom sizes

Tecan's range of ASTM compliant Photo Electro Formed (PEF) sieves can be used to effectively sort, sift and classify materials by particle size and shape.

PEF enables the production of rigid sieve materials with perfectly formed, consistent apertures and smooth surfaces; providing strength whilst eliminating particle entrapment and simplifying cleaning. The hard nickel material typically features square apertures; however alternative aperture shapes are available on request.

Sieves can also be supplied with an integral 'honeycomb' support grid, above or below the active surface for additional rigidity and durability.

View our standard range, Contact us now to discuss your bespoke precision sieve requirements or talk to one of our technical advisers who are online now to answer any questions you may have - simply click on the live help icon.